English to French Tech/Engineering Patents (in a patent) a method and system for identifying and measuring a defect that reduces transparency in a a substrate for a security

The method of measuring a defect level of a région of a substrate may further include the step of comparing the defect score of each région with a predefined defect score range. The method may also further include the step of determining whether the defect score of each région is within the predefined defect score range based on said comparison.

an image analysis apparatus for:
calculating a statistical measure of the light intensity data in the région; and
assigning a defect score to the région based on the statistical measure of the light intensity data in the région.

the image analysis apparatus further carries out the steps of:
comparing the defect score of the région with a predefined defect score range;
determining whether the defect score of each région is within the predefined defect score range based on said comparison; and
transmitting a defect level signal to an output device, based on said comparison.